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Fitzsimmons, R., Koekkoek, R., Caragianis-Broadbridge, C., Lehman, A., & Cummings, K. (2005). An exploration of microscopy for educational applications in the high school classroom. MRS Proceedings, 909, 80–85. https://doi.org/10.1557/PROC-0909-PP03-17

This project was initiated with an undergraduate student's exploration of two advanced research tools: the scanning electron microscope (SEM) and the atomic force microscope (AFM). A research project was developed to study the application of microscopy to introductory physics instruction, Nine modules covering various aspects of introductory physics were created. Module components included discussions, laboratory experiments and assessments. Four of the nine modules were implemented in various high school classes. Assessments were used to compare student learning with the modules versus standard textbook/lecture techniques, Preliminary results of this study are presented along with recently developed methods created to facilitate implementation of these modules within the high school classroom. © 2006 Materials Research Society.

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Caragianis-Broadbridge, C., Edgecumbe, H., Osenko, G., Lehman, A., Alter, L., & Tully, J. C. (2007). A partnership inspiring interest in MSE careers: the center for research on interface structures and phenomena (CRISP). MRS Proceedings, 1046, 28–33. https://doi.org/10.1557/PROC-1046-W02-09

The intent of the CRISP education and outreach effort is to use materials science as a vehicle for enhancing the scientific literacy and knowledge of kindergarten through postgraduate level students. A challenging part of our mission has been inspiring students to take the next step and consider further study (or a career) in the field of Materials Science and Engineering (MSE). The CRISP educational programs were developed through a partnership between Yale University, Southern Connecticut State University and the urban school district of New Haven, CT. An overview of the methods and results of both formal and informal educational program components is included for years one and two of the CRISP MRSEC. This paper will focus on two CRISP programs: 1) MRSEC Initiative for Multidisciplinary Education & Research (MIMER) and 2) "Exploring Materials Science" mobile kits. The evaluation data indicates that the approach used in developing these educational programs is important. Specifically, the impact of these programs is influenced by the students' ability to relate the acquired knowledge to real life applications and technologies. In particular, emphasizing career opportunities rather than just presenting content-based programs is a key element to increasing interest towards further study in Materials Science and Engineering. © 2008 Materials Research Society.

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Pechkis, D. L., Caragianis-Broadbridge, C., Lehman, A. H., Klein, K., Han, J., & Ma, T.-P. (2002). Thin film thickness and grain structure determination of ferroelectric SrBi2Ta2O9 with cross-sectional atomic force microscopy. Microscopy and Microanalysis, 8(S02), 774–775. https://doi.org/10.1017/s1431927602106672

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Caragianis-Broadbridge, C., Han, J., Ma, T. P., Lehman, A. H., Zhu, W., Luo, Z., Pechkis, D., & Laube, B. L. (2001). Microstructure and physical properties of ferroelectric-gate memory capacitors with various buffer layers. MRS Proceedings, 666, F851–F856. https://doi.org/10.1557/PROC-666-F8.5

This paper reports the microstructure and physical properties of ferroelectric capacitors formed from SrBi2Ta2O9 (SBT) layers on Si with various buffer layers including jet-vapor deposited silicon nitride, zirconium oxide, hafnium oxide and thermally grown silicon oxide. Results from cross-sectional transmission electron microscopy (X-TEM), energy dispersive spectroscopy (EDS), X-Ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and non-contact atomic force microscopy (nc-AFM) data coupled with capacitance-voltage (C-V) and current-voltage (I-V) data indicate that both the microstructure and physical properties of SBT films deposited on silicon are dependent on the buffer layer material employed.

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Sawicki, M., Munhutu, P., Daponte, J. S., Caragianisbroadbridge, C., Lehman, A., Sadowski, T., Garcia, E., Heyden, C., Mirabelle, L., & Benjamin, P. (2009). Computer assisted analysis of microscopy images. Visualization and Data Analysis, 7243, 724305. https://doi.org/10.1117/12.805613

The use of Transmission Electron Microscopy (TEM) to characterize the microstructure of a material continues to grow in importance as technological advancements become increasingly more dependent on nanotechnology 1. Since nanoparticle properties such as size (diameter) and size distribution are often important in determining potential applications, a particle analysis is often performed on TEM images. Traditionally done manually, this has the potential to be labor intensive, time consuming, and subjective 2. To resolve these issues, automated particle analysis routines are becoming more widely accepted within the community 3. When using such programs, it is important to compare their performance, in terms of functionality and cost. The primary goal of this study was to apply one such software package, ImageJ to grayscale TEM images of nanoparticles with known size. A secondary goal was to compare this popular open-source general purpose image processing program to two commercial software packages. After a brief investigation of performance and price, ImageJ was identified as the software best suited for the particle analysis conducted in the study. While many ImageJ functions were used, the ability to break agglomerations that occur in specimen preparation into separate particles using a watershed algorithm was particularly helpful 4. © 2009 SPIE-IS&T.

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Su, J., Cui, G., Gherasimova, M., Tsukamoto, H., Han, J., Ciuparu, D., Lim, S., Pfefferle, L. D., He, Y., Nurmikko, A. V., Broadbridge, C., & Lehman, A. H. (2005). Catalytic growth of group III-nitride nanowires and nanostructures by metalorganic chemical vapor deposition. Applied Physics Letters, 86(1), 13105. https://doi.org/10.1063/1.1843281

We report flexible synthesis of group III-nitride nanowires and nanostructures by metalorganic chemical vapor deposition (MOCVD) via a catalytic vapor-liquid-solid (VLS) growth mechanism. Supersaturation and surface stoichiometry strongly influence the stability of liquid droplets and growth selectivity. To facilitate and sustain the VLS growth, indium catalyst is introduced based on thermodynamic consideration. The employment of mesoporous molecular sieves (MCM-41) helps to prevent the coalescence of catalyst droplets and to promote nucleation statistics. Both GaN and AlN nanowires have been synthesized using MOCVD. Three-dimensional AlNGaN trunk-branch nanostructures are reported to illustrate the versatility of incorporating the VLS mechanism into MOCVD process. © 2005 American Institute of Physics.

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Su, J., Gherasimova, M., Cui, G., Han, J., Lim, S., Ciuparu, D., Pfefferle, L. D., He, Y., Nurmikko, A. V., Broadbridge, C., Lehman, A. H., Onuma, T., Kurimoto, M., & Chichibu, S. F. (2004). Vapor-liquid-solid growth of III-Nitride nanowires and heterostructures by metal-organic chemical vapor deposition. MRS Proceedings, 831, 753–758. https://doi.org/10.1557/PROC-831-E12.4

We report flexible synthesis of III-Nitride nanowires and heterostructures by metal-organic chemical vapor deposition (MOCVD) via a catalytic vapor-liquid-solid (VLS) growth mechanism. Indium is used as an in-situ catalyst to facilitate and sustain the stability of liquid phase droplet for VLS growth based on thermodynamic consideration. The employment of mesoporous molecular sieves (MCM-41) helps to prevent the coalescence of catalyst droplets and to promote nucleation statistics. Cathodoluminescence (CL) of GaN nanowires shows near band-edge emission at 370nm, and strong E 2 phonon peak is observed at room temperature in Raman scattering spectra. Both binary GaN and AlN nanowires have been synthesized by MOCVD. Three-dimensional AlN/GaN trunk-branch nanostructures are reported to illustrate the versatility of incorporating the VLS mechanism into MOCVD process. © 2005 Materials Research Society.

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