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  • Monitoring of electrical distribution grids requires the joint processing of electrical measurements from different grid locations. Such type of processing is influenced by inaccuracies in measurement data originating from measurement errors, non-ideal clocks in measurement devices, and from time averaging of measurands as part of the data collection process. This paper introduces an approach to assess the impact of these three different measurement artifacts in realistic measurement scenarios of electrical distribution grids. A case study of power loss calculation in a real-life medium-voltage grid is presented, covering both technical loss obtained from current measurement and total loss obtained from power measurements. The results show that total loss in general is more robust to aggregation of power measurements over longer measurement intervals, while it is more sensitive to measurement errors and clock offsets. The results of the study are important for quantifying the trustworthiness of the obtained loss values and for the future enhancement of the measurement data collection process. © 2023 ACM.

  • The operation and planning of distribution grids require the joint processing of measurements from different grid locations. Since measurement devices in low-and medium-voltage grids lack precise clock synchronization, it is important for data management platforms of distribution system operators to be able to account for the impact of nonideal clocks on measurement data. This paper formally introduces a metric termed Additive Alignment Error to capture the impact of misaligned averaging intervals of electrical measurements. A trace-driven approach for retrieval of this metric would be computationally costly for measurement devices, and therefore, it requires an online estimation procedure in the data collection platform. To overcome the need of transmission of high-resolution measurement data, this paper proposes and assesses an extension of a Markov-modulated process to model electrical traces, from which a closed-form matrix analytic formula for the Additive Alignment Error is derived. A trace-driven assessment confirms the accuracy of the model-based approach. In addition, the paper describes practical settings where the model can be utilized in data management platforms with significant reductions in computational demands on measurement devices. © 2021 by the authors. Licensee MDPI, Basel, Switzerland.

Last update from database: 3/13/26, 4:15 PM (UTC)

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