Su, D., Yang, B., Jiang, N., Sawicki, M., Broadbridge, C., Couillard, M., Reiner, J. W., Walker, F., Ahn, C. H., & Zhu, Y. (2010). Valence electron energy-loss spectroscopy of ultrathin SrTiO3 films grown on silicon (100) single crystal. Applied Physics Letters, 96(12), 121914. https://doi.org/10.1063/1.3364144