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An exploration of microscopy for educational applications in the high school classroom
Resource type
Authors/contributors
- Fitzsimmons, Ryan (Author)
- Koekkoek, Robert (Author)
- Caragianis-Broadbridge, Christine (Author)
- Lehman, Ann (Author)
- Cummings, Karen (Author)
Title
An exploration of microscopy for educational applications in the high school classroom
Abstract
This project was initiated with an undergraduate student's exploration of two advanced research tools: the scanning electron microscope (SEM) and the atomic force microscope (AFM). A research project was developed to study the application of microscopy to introductory physics instruction, Nine modules covering various aspects of introductory physics were created. Module components included discussions, laboratory experiments and assessments. Four of the nine modules were implemented in various high school classes. Assessments were used to compare student learning with the modules versus standard textbook/lecture techniques, Preliminary results of this study are presented along with recently developed methods created to facilitate implementation of these modules within the high school classroom. © 2006 Materials Research Society.
Proceedings Title
MRS Proceedings
Date
2005
Volume
909
Pages
80-85
ISBN
02729172 (ISSN); 1558998640 (ISBN); 9781558998643 (ISBN)
Citation Key
pop00358
Language
English
Extra
1 citations (Crossref) [2023-10-31]
Citation Key Alias: lens.org/060-305-083-686-777
tex.type: [object Object]
Citation
Fitzsimmons, R., Koekkoek, R., Caragianis-Broadbridge, C., Lehman, A., & Cummings, K. (2005). An exploration of microscopy for educational applications in the high school classroom. MRS Proceedings, 909, 80–85. https://doi.org/10.1557/PROC-0909-PP03-17
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