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On error reduction by the symmetric rejection method in multi-stage biometric verification systems

Resource type
Authors/contributors
Title
On error reduction by the symmetric rejection method in multi-stage biometric verification systems
Abstract
A multi-stage biometric verification system serially activates its verifiers and improves performance-cost trade-off by allowing users to submit a subset of the available biometrics. In the heart of a verifier in multi-stage systems lies the concept of ‘reject option’ where a reject region is used to identify a bad quality test sample. If the match-score falls inside the reject region, no binary (genuine/impostor) decision is made in the current stage and the verifier in the next stage is activated. Recent studies have demonstrated a significant promise of the ‘symmetric rejection method’ in choosing a suitable reject region for multi-stage verification systems. In this paper, we delve into the symmetric rejection method to gain more insights into its error reduction capabilities. Specifically, we develop a theory which mathematically proves that the symmetric rejection method reduces the false accept rate and false reject rate. Then, we empirically validate our theory. Results show that the symmetric rejection method significantly reduces the error rates, both the false accept rate and false reject rate. © 2022, The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature.
Publication
Pattern Analysis and Applications
Date
2022
Citation Key
hossainErrorReductionSymmetric2022
ISSN
1433-7541
Archive
Scopus
Language
English
Library Catalog
Scopus
Extra
0 citations (Crossref) [2023-10-31]
Citation
Hossain, M. S., Chen, J., & Rahman, K. (2022). On error reduction by the symmetric rejection method in multi-stage biometric verification systems. Pattern Analysis and Applications. Scopus. https://doi.org/10.1007/s10044-022-01118-8