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Low loss EELS study of the ultrathin SrTiO3 film grown on the si single crystal

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Resource type
Journal Article
Authors/contributors
Title
Low loss EELS study of the ultrathin SrTiO3 film grown on the si single crystal
Publication
Microscopy and Microanalysis
Date
2009-07-01, July 2009
Volume
15
Issue
S2
Pages
1040-1041
Journal Abbr
Microsc. Microanal.
DOI
10.1017/s143192760909566x
Citation Key
lens.org/005-981-024-847-47X
URL
http://journals.cambridge.org/action/displayFulltext?type=1&fid=5909036&volumeId=15&issueId=S2&aid=5909032&bodyId=&membershipNumber=&societyETOCSession=; https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S143192760909566X; https://lens.org/005-981-024-847-47X
ISSN
14319276 (ISSN)
Language
English
Extra
0 citations (Crossref) [2023-10-31] Citation Key Alias: pop00259 tex.type: [object Object]
Citation
Su, D., Couillard, M., Sawicki, M., Broadbridge, C., & Zhu, Y. (2009). Low loss EELS study of the ultrathin SrTiO3 film grown on the si single crystal. Microscopy and Microanalysis, 15(S2), 1040–1041. https://doi.org/10.1017/s143192760909566x
Link to this record
https://libweb.southernct.edu/authors/bibliography/Y8TJ6863