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Computational nanocharacterization for combinatorially developed bulk metallic glass
Resource type
Authors/contributors
- Gossett, Eric (Author)
- Scanley, Ellen (Author)
- Liu, Yanhui (Author)
- Li, Yanglin (Author)
- Liu, Ze (Author)
- Sohn, Sungwoo (Author)
- Schroers, Jan (Author)
- Broadbridge, Christine (Author)
- Schwendemann, Todd C. (Author)
Title
Computational nanocharacterization for combinatorially developed bulk metallic glass
Abstract
Bulk metallic glasses synthesized at specialized facilities at Yale using magnetron cosputtering are sent to Southern Connecticut State University for elemental characterization. Characterization is done using a Zeiss Sigma VP SEM coupled with an Oxford EDS. Characterization is automated using control software provided by Oxford. Collected data is processed and visualized using computational methods developed internally. Processed data is then organized into a database suitable for web retrieval. This technique allows for the rapid characterization of a combinatorial wafer to be carried out in ~11 hours for a single wafer containing ~600 unique compounds. © 2015 World Scientific Publishing Company.
Publication
International Journal of High Speed Electronics and Systems
Date
2015-09-01, September 2015
Volume
24
Issue
3n04
Pages
1520012
Journal Abbr
Int. J. High Speed Electron. Syst.
Citation Key
URL
ISSN
01291564 (ISSN)
Language
English
Extra
0 citations (Crossref) [2023-10-31]
Citation Key Alias: pop00134
tex.type: [object Object]
Citation
Gossett, E., Scanley, E., Liu, Y., Li, Y., Liu, Z., Sohn, S., Schroers, J., Broadbridge, C., & Schwendemann, T. C. (2015). Computational nanocharacterization for combinatorially developed bulk metallic glass. International Journal of High Speed Electronics and Systems, 24(3n04), 1520012. https://doi.org/10.1142/s0129156415200128
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