Thin film thickness and grain structure determination of ferroelectric SrBi2Ta2O9 with cross-sectional atomic force microscopy
Resource type
Authors/contributors
- Pechkis, Daniel L. (Author)
- Caragianis-Broadbridge, Christine (Author)
- Lehman, Ann Hein (Author)
- Klein, Kate (Author)
- Han, Jin-ping (Author)
- Ma, Tso-Ping (Author)
Title
Thin film thickness and grain structure determination of ferroelectric SrBi2Ta2O9 with cross-sectional atomic force microscopy
Publication
Microscopy and Microanalysis
Date
2002-08-01, August 2002
Volume
8
Issue
S02
Pages
774-775
Journal Abbr
Microsc. Microanal.
Citation Key
URL
Language
English
Extra
0 citations (Crossref) [2023-10-31]
Citation Key Alias: pop00148
tex.type: [object Object]
Citation
Pechkis, D. L., Caragianis-Broadbridge, C., Lehman, A. H., Klein, K., Han, J., & Ma, T.-P. (2002). Thin film thickness and grain structure determination of ferroelectric SrBi2Ta2O9 with cross-sectional atomic force microscopy. Microscopy and Microanalysis, 8(S02), 774–775. https://doi.org/10.1017/s1431927602106672
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