Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles
Resource type
Authors/contributors
- Calvin, Scott (Author)
- Luo, Shuixiang (Author)
- Caragianisbroadbridge, C (Author)
- Mcguinness, J K (Author)
- Anderson, Eric (Author)
- Lehman, A (Author)
- Wee, K H (Author)
- Morrison, Shannon A (Author)
- Kurihara, L K (Author)
Title
Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles
Abstract
Curve fitting of extended x-ray absorption fine structure (EXAFS) spectra, transmission electron microscopy (TEM) imaging, and Scherrer analysis of x-ray diffraction (XRD) are compared as methods for determining the mean crystallite size in polydisperse samples of platinum nanoparticles. By applying the techniques to mixtures of pure samples, it is found that EXAFS correctly determines the relative mean sizes of these polydisperse samples, while XRD tends to be weighted more toward the largest crystallites in the sample. Results for TEM are not clear cut, due to polycrystallinity and aggregation, but are consistent with the other results. © 2005 American Institute of Physics.
Publication
Applied Physics Letters
Date
2005
Volume
87
Issue
23
Pages
233102
Journal Abbr
Appl Phys Lett
Citation Key
pop00078
ISSN
00036951 (ISSN)
Language
English
Extra
68 citations (Crossref) [2023-10-31]
Citation Key Alias: lens.org/112-863-384-595-634
tex.type: [object Object]
Citation
Calvin, S., Luo, S., Caragianisbroadbridge, C., Mcguinness, J. K., Anderson, E., Lehman, A., Wee, K. H., Morrison, S. A., & Kurihara, L. K. (2005). Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles. Applied Physics Letters, 87(23), 233102. https://doi.org/10.1063/1.2137872
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